Electronic imaging platforms in the field of inspection of semiconductor materials, namely, semiconductor wafers and reticles 009-3120
半导体材料检测领域的电子成像平台，即用于半导体晶圆和掩模版
Chinese
半导体材料检测领域的电子成像平台，即用于半导体晶圆和掩模版
English
Electronic imaging platforms in the field of inspection of semiconductor materials, namely, semiconductor wafers and reticles
Spanish
Plataformas de imagen electrónica en el campo de la inspección de materiales semiconductores, a saber, obleas y retículas semiconductoras
- Term ID
- 009-3120
- Class
- 09
- Type
- Goods
- Status
- Active · added, not since modified (A)
- Effective date
- 2008-05-29
- Version
- 09-2007