Optical inspection apparatus for inspection of semiconductor materials, namely, semiconductor wafers, reticles, and photomasks 009-3122
用于检查半导体材料（即半导体晶圆、光罩和光掩模）的光学检查设备
Chinese
用于检查半导体材料（即半导体晶圆、光罩和光掩模）的光学检查设备
English
Optical inspection apparatus for inspection of semiconductor materials, namely, semiconductor wafers, reticles, and photomasks
Spanish
Aparato de inspección óptica para la inspección de materiales semiconductores, a saber, obleas semiconductoras, retículas y fotomáscaras
- Term ID
- 009-3122
- Class
- 09
- Type
- Goods
- Status
- Active · added, not since modified (A)
- Effective date
- 2008-05-29
- Version
- 09-2007