Probes for testing integrated circuits 009-770
用于测试集成电路的探针
Chinese
用于测试集成电路的探针
English
Probes for testing integrated circuits
Spanish
Sondas para probar circuitos integrados
- Term ID
- 009-770
- Class
- 09
- Type
- Goods
- Status
- Active · added, not since modified (A)
- Effective date
- 2001-06-01
- Version
- 07-1997