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US Trademark Classification

Scanning electron microscopes (SEM) and structural parts thereof 009-7779

扫描电子显微镜(SEM)及其结构部件

Chinese 扫描电子显微镜(SEM)及其结构部件
English Scanning electron microscopes (SEM) and structural parts thereof
Spanish Microscopios electrónicos de barrido (MEB) y sus partes estructurales
Term ID
009-7779
Class
09
Type
Goods
Status
Active · added, not since modified (A)
Effective date
2026-04-16
Version
13-2026